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24LC32AP SNA31 EMU8000 IRFP1 QPF7N65C 30006 1232034 CDLL4627
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  semiconductor group 1 1999-02-04 wesentliche merkmale l gaas-ir-lumineszenzdioden, hergestellt im schmelzepitaxieverfahren l gute linearit?t ( i e = f [ i f ]) bei hohen str?men l sehr hoher wirkungsgrad l hohe zuverl?ssigkeit l hohe impulsbelastbarkeit l sfh 415: geh?usegleich mit sfh 300, sfh 203 anwendungen l ir-fernsteuerung von fernseh- und rundfunkger?ten, videorecordern, lichtdimmern l ger?tefernsteuerungen features l gaas infrared emitting diodes, fabricated in a liquid phase epitaxy process l good linearity ( i e = f [ i f ]) at high currents l high efficiency l high reliability l high pulse handling capability l sfh 415: same package as sfh 300, sfh 203 applications l ir remote control of hi-fi and tv-sets, video tape recorders, dimmers l remote control of various equipment gaas-ir-lumineszenzdioden gaas infrared emitters sfh 415 sfh 416 ma?e in mm, wenn nicht anders angegeben/dimensions in mm, unless otherwise specified. 7.8 7.5 9.0 8.2 29 27 1.8 1.2 4.8 4.2 ?5.1 ?4.8 0.8 0.4 0.6 0.4 2.54 mm spacing 5.9 5.5 0.6 0.4 area not flat chip position cathode geo06645 5.9 5.5 0.6 0.4 ?5.1 ?4.8 2.54 mm spacing 5.7 5.5 6.9 6.1 4.0 3.4 29.5 27.5 1.8 1.2 0.8 0.4 area not flat 0.6 0.4 cathode (diode) chip position gex06630 collector (transistor) fex06630 fexf6626
semiconductor group 2 1999-02-04 sfh 415 sfh 416 grenzwerte ( t a = 25 c) maximum ratings typ type bestellnummer ordering code geh?use package sfh 415 q62702-p296 5-mm-led-geh?use (t 1 3 / 4 ), schwarz eingef?rbt, an- schlu? im 2.54-mm-raster ( 1 / 10 ), kathodenkennzeichnung: krzerer anschlu? 5 mm led package (t 1 3 / 4 ), black-colored epoxy resin lens, solder tabs lead spacing 2.54 mm ( 1 / 10 ), cathode marking: short lead sfh 415-t q62702-p1136 sfh 415-u q62702-p1137 sfh 416-r q62702-p1139 bezeichnung description symbol symbol wert value einheit unit betriebs- und lagertemperatur operating and storage temperature range t op ; t stg C 40 ... + 100 c sperrschichttemperatur junction temperature t j 100 c sperrspannung reverse voltage v r 5v durchla?strom forward current i f 100 ma sto?strom, t p = 10 m s, d = 0 surge current i fsm 3a verlustleistung power dissipation p tot 165 mw w?rmewiderstand thermal resistance r thja 450 k/w
semiconductor group 3 1999-02-04 sfh 415 sfh 416 kennwerte ( t a = 25 c) characteristics bezeichnung description symbol symbol wert value einheit unit wellenl?nge der strahlung wavelength at peak emission i f = 100 ma, t p = 20 ms l peak 950 nm spektrale bandbreite bei 50 % von i max spectral bandwidth at 50 % of i max i f = 100 m a dl 55 nm abstrahlwinkel half angle sfh 415 sfh 416 j j 17 28 grad deg. aktive chipfl?che active chip area a 0.09 mm 2 abmessungen der aktive chipfl?che dimension of the active chip area l b l w 0.3 0.3 mm abstand chipoberfl?che bis linsenscheitel distance chip front to lens top sfh 415 sfh 416 h h 4.2 ... 4.8 3.4 ... 4.0 mm mm schaltzeiten, i e von 10 % auf 90 % und von 90 % auf 10 %, bei i f = 100 ma, r l = 50 w switching times, i e from 10 % to 90 % and from 90 % to 10 %, i f = 100 ma, r l = 50 w t r , t f 0.5 m s kapazit?t capacitance v r = 0 v, f = 1 mhz c o 25 pf durchla?spannung forward voltage i f = 100 ma, t p = 20 ms i f = 1 a, t p = 100 m s v f v f 1.3 ( 1.5) 2.3 ( 2.8) v v sperrstrom reverse current v r = 5 v i r 0.01 ( 1 )m a gesamtstrahlungsflu? total radiant flux i f = 100 ma, t p = 20 ms f e 22 mw
semiconductor group 4 1999-02-04 sfh 415 sfh 416 gruppierung der strahlst?rke i e in achsrichtung gemessen bei einem raumwinkel w = 0.01 sr grouping of radiant intensity i e in axial direction at a solid angle of w = 0.01 sr temperaturkoeffizient von i e bzw. f e , i f = 100 ma temperature coefficient of i e or f e , i f = 100 ma tc i C 0.5 %/k temperaturkoeffizient von v f , i f = 100 ma temperature coefficient of v f , i f = 100 ma tc v C 2 mv/k temperaturkoeffizient von l , i f = 100 ma temperature coefficient of l , i f = 100 ma tc l + 0.3 nm/k bezeichnung description symbol symbol werte values einheit unit sfh 415 sfh 415-t sfh 415-u sfh 416-r strahlst?rke radiant intensity i f = 100 ma, t p = 20 ms i e min i e max 3 25 C 25 50 > 40 C > 10 C mw/sr mw/sr strahlst?rke radiant intensity i f = 1 a, t p = 100 m s i e typ. C 380 600 150 mw/sr kennwerte ( t a = 25 c) characteristics (contd) bezeichnung description symbol symbol wert value einheit unit
semiconductor group 5 1999-02-04 sfh 415 sfh 416 relative spectral emission i rel = f ( l ) forward current i f = f ( v f ), single pulse, t p = 20 m s ohrd1938 l rel i 0 880 920 960 1000 nm 1060 20 40 60 80 % 100 10 ohr01554 f v -3 -2 10 -1 10 0 10 1 10 0123456v8 a i f radiant intensity single pulse, t p = 20 m s i e i e 100 ma = f ( i f ) ohr01551 10 -3 i f -2 10 10 -1 10 0 10 1 10 2 i e 100 ma e i -2 10 -1 10 0 10 1 10 a a max. permissible forward current i f = f ( t a ) ohr00883 0 f i 0 20 40 60 80 100 120 20 40 60 80 100 120 ma ?c t a r thja = 450 k/w radiation characteristics sfh 416 i rel = f ( j ) ohr01553 0? 20? 40? 60? 80? 100? 120? 0.4 0.6 0.8 1.0 100? 90? 80? 70? 60? 50? 0? 10? 20? 30? 40? 0 0.2 0.4 0.6 0.8 1.0 j radiation characteristics sfh 415 i rel = f ( j ) ohr01552 90 80 70 60 50 40 30 20 10 20 40 60 80 100 120 0.4 0.6 0.8 1.0 j 0.2 0.4 0.6 0.8 1.0 100 0 0 permissible pulse handling capability i f = f ( t ), t c = 25 c, duty cycle d = parameter t ohr00860 p -5 10 10 2 i f 10 3 10 4 5 dc 0.2 0.5 0.1 0.005 0.01 0.02 0.05 t p t i f t p t d = 5 ma -4 10 -3 10 -2 10 -1 10 0 10 1 10 2 10 s d =


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